✦ LIBER ✦
Stress engineering and proton radiation influence on off-state leakage current in triple-gate SOI devices
✍ Scribed by Agopian, Paula Ghedini Der; Bordallo, Caio Cesar Mendes; Simoen, Eddy; Claeys, Cor; Martino, João Antonio
- Book ID
- 123343945
- Publisher
- Elsevier Science
- Year
- 2013
- Tongue
- English
- Weight
- 536 KB
- Volume
- 90
- Category
- Article
- ISSN
- 0038-1101
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