𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2011 International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Tianjin, China (2011.11.17-2011.11.18)] 2011 IEEE International Conference of Electron Devices and Solid-State Circuits - Impact of stress on band-to-band tunneling current in SOI MOSFET based on first-principles calculation

✍ Scribed by Li, Y. Z.; Zhang, L. J.; Wang, Z. O.; Chen, Z.; Li, Y. Q.; Lu, Z. H.; Mao, L. F.

Book ID: 120823362
Publisher: IEEE
Year: 2011
Weight: 244 KB
Category: Article
ISBN: 1457719967
DOI: 10.1109/EDSSC.2011.6117710

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2011 International Conference of E

[IEEE 2011 International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Tianjin, China (2011.11.17-2011.11.18)] 2011 IEEE International Conference of Electron Devices and Solid-State Circuits - Study on transport characteristics of CNTFET based on NEGF theory

✍ Xinghui, Liu; Junsong, Zhang; Zhong, Qin; Fanguang, Zeng; Jiwei, Wang; Chunhua, 📂 Article 📅 2011 🏛 IEEE ⚖ 367 KB

[IEEE 2011 International Conference of E

[IEEE 2011 International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Tianjin, China (2011.11.17-2011.11.18)] 2011 IEEE International Conference of Electron Devices and Solid-State Circuits - a DC-DC boost converter based on SiC MOSFET and SiC SBD

✍ Chao, Zhang; Xiao-Yan, Tang; Yu-Ming, Zhang; Wen, Wang; Yi-Men, Zhang 📂 Article 📅 2011 🏛 IEEE ⚖ 169 KB

[IEEE 2011 International Conference of E

[IEEE 2011 International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Tianjin, China (2011.11.17-2011.11.18)] 2011 IEEE International Conference of Electron Devices and Solid-State Circuits - Reliability analysis of weak signal detection based on Duffing oscillator

✍ Chen, Xinguo; Yang, Xiaofei; Wang, Jieyun; Han, Weiwei 📂 Article 📅 2011 🏛 IEEE ⚖ 91 KB

[IEEE 2011 International Conference of E

[IEEE 2011 International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Tianjin, China (2011.11.17-2011.11.18)] 2011 IEEE International Conference of Electron Devices and Solid-State Circuits - Preparation of micro fluidic chip based on SU-8 mold

✍ Wu, Yuan-Qing; Yao, Su-Ying 📂 Article 📅 2011 🏛 IEEE ⚖ 194 KB

[IEEE 2011 International Conference of E

[IEEE 2011 International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Tianjin, China (2011.11.17-2011.11.18)] 2011 IEEE International Conference of Electron Devices and Solid-State Circuits - The effects of gamma irradiation on GaAs HBT

✍ Shi, Yang; Hong-Liang, Lu; Yu-Ming, Zhang; Yi-Men, Zhang; Jin-Can, Zhang; Hai-Pe 📂 Article 📅 2011 🏛 IEEE ⚖ 110 KB

[IEEE 2011 International Conference of E

[IEEE 2011 International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Tianjin, China (2011.11.17-2011.11.18)] 2011 IEEE International Conference of Electron Devices and Solid-State Circuits - A novel dynamic element matching technique in current-steering DAC

✍ Su, Wei; Wang, Yuan; Zhao, Junlei; Jia, Song; Zhang, Xing 📂 Article 📅 2011 🏛 IEEE ⚖ 137 KB