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[IEEE 2011 International Conference of Electron Devices and Solid-State Circuits (EDSSC) - Tianjin, China (2011.11.17-2011.11.18)] 2011 IEEE International Conference of Electron Devices and Solid-State Circuits - Reliability analysis of weak signal detection based on Duffing oscillator

✍ Scribed by Chen, Xinguo; Yang, Xiaofei; Wang, Jieyun; Han, Weiwei

Book ID: 115473114
Publisher: IEEE
Year: 2011
Weight: 91 KB
Volume: 0
Category: Article
ISBN: 1457719967
DOI: 10.1109/edssc.2011.6117741

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