β Scribed by Tsuno, K. ;Yamamoto, T.
No coin nor oath required. For personal study only.
π SIMILAR VOLUMES
## Abstract Dislocations in deformed silicon crystals have been studied by highβresolution electron microscopy with the axial illumination along the [110] direction using a 1 MV electron microscope. Extended 60 dislocations, Zβshape faulted dipoles and stacking fault tetrahedra were observed in ato
Scanning microdeformation microscopy is a kind of a.c. contact force microscopy that can image the subsurface of the investigated sample. This paper presents a Γrst step to determine experimentally the investigation depth of this near-Γeld acoustic method. A set of silicon samples with well-known ch
In-situ deformation of aluminium alloy polycrystals has been investigated within a high-voltage transmission electron microscope in order to observe dislocation phenomena related to the Portevin-Le Chatelier effect. The alloys examined are commercially pure aluminium, binary AI-2 at.% Ag, A1 2 at."/