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Nonlocal effects in ellipsometry of metallic films on metals

✍ Scribed by K. Kempa; R.R. Gerhardts

Book ID
118985975
Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
912 KB
Volume
150
Category
Article
ISSN
0039-6028

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πŸ“œ SIMILAR VOLUMES

Spectroscopic ellipsometry measurements
Spectroscopic ellipsometry measurements of thin metal films
✍ Tompkins, Harland G.; Tasic, Sonja; Baker, Jeff; Convey, Diana πŸ“‚ Article πŸ“… 2000 πŸ› John Wiley and Sons 🌐 English βš– 151 KB πŸ‘ 2 views

Optical methods are used to determine the thickness of thin metal films, with emphasis on spectroscopic ellipsometry and transmission. We discuss the conditions where this is possible and how to determine the optical constants for the material. The determination of the thickness of each of two metal