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Ellipsometry study of thin metallic films under constraint by the size effect

✍ Scribed by Y.S. Hor; C.S. Chang; J.T. Lue

Publisher: Springer
Year: 1998
Tongue: English
Weight: 344 KB
Volume: 67
Category: Article
ISSN: 1432-0630
DOI: 10.1007/s003390050817

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