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Non-destructive characterization of recrystallization kinetics using three-dimensional X-ray diffraction microscopy

✍ Scribed by E.M. Lauridsen; S. Schmidt; S.F. Nielsen; L. Margulies; H.F. Poulsen; D. Juul Jensen

Book ID: 113896076
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 358 KB
Volume: 55
Category: Article
ISSN: 1359-6462
DOI: 10.1016/j.scriptamat.2006.02.028

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