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Characterization of three-dimensional crystallographic distributions using polychromatic X-ray microdiffraction

✍ Scribed by G.E. Ice; J.W.L. Pang; R.I. Barabash; Y. Puzyrev

Book ID
113896094
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
455 KB
Volume
55
Category
Article
ISSN
1359-6462

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## Abstract Intrinsic stresses due to lattice mismatch, high densities of threading dislocations, and extrinsic stresses resulting from the mismatch in the coefficients of thermal expansion, are present in almost all III‐Nitride heterostructures. Stress relaxation in the GaN layers occurs in conven