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Quantitative characterization of the three-dimensional microstructure of polycrystalline Al-Sn using X-ray microtomography

✍ Scribed by K. M. Döbrich; C. Rau; C. E. Krill

Book ID: 107440569
Publisher: The Minerals, Metals & Materials Society
Year: 2004
Tongue: English
Weight: 585 KB
Volume: 35
Category: Article
ISSN: 1073-5623
DOI: 10.1007/s11661-004-0144-2

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