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Nominal model for structure-property relations of chiral dielectric sculptured thin films

✍ Scribed by J.A. Sherwin; A. Lakhtakia

Book ID
104350999
Publisher
Elsevier Science
Year
2001
Tongue
English
Weight
816 KB
Volume
34
Category
Article
ISSN
0895-7177

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✦ Synopsis

The Bruggeman formalism is implemented to estimate the permittivity dyadics of chiral dielectric sculptured thin films (STFs), called thin-film helicoidal bianisotropic mediums (TFHBMs), modelled as helicoidally arranged stacks of ellipsoidal inclusions in vacuum. Spectral maximums of several observable optical properties of axially excited TFHBM slabs are examined as functions of inclusion shape, volume fraction and orientation. Changes in the transverse aspect ratio of the ellipsoidal inclusions significantly affect the predicted optical properties of the TFHBM. A critical value for the transverse aspect ratio of the ellipsoids can be found such that optical activity disappears when all other parameters are fixed. The orientation of the inclusions significantly affects the value of optical property maximums, and can be made to suppress optical activity completely. A distribution of orientations decreases various measures of optical activity.

πŸ“œ SIMILAR VOLUMES

Errata to: β€œnominal model for structure-
Errata to: β€œnominal model for structure-property relations of chiral dielectric sculptured thin films”: Mathl. Comput. Modelling, Vol. 34, No. 12/13, pp. 1499–1514, 2001
✍ J.A. Sherwin; A. Lakhtakia πŸ“‚ Article πŸ“… 2002 πŸ› Elsevier Science 🌐 English βš– 644 KB

In the subject paper, calculations reported for the stated angular valuea of x were actually made for n/2 -x. Consequently, Figures l-7 are incorrect, and a few quantitative, but not qualitative, conclusions drawn therefrom are also incorrect. The error in the computer program came to light very rec