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On calibration of a nominal structure–property relationship model for chiral sculptured thin films by axial transmittance measurements

✍ Scribed by J.A. Sherwin; A. Lakhtakia; I.J. Hodgkinson

Book ID
118539842
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
177 KB
Volume
209
Category
Article
ISSN
0030-4018

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Nominal model for structure-property rel
Nominal model for structure-property relations of chiral dielectric sculptured thin films
✍ J.A. Sherwin; A. Lakhtakia 📂 Article 📅 2001 🏛 Elsevier Science 🌐 English ⚖ 816 KB

The Bruggeman formalism is implemented to estimate the permittivity dyadics of chiral dielectric sculptured thin films (STFs), called thin-film helicoidal bianisotropic mediums (TFHBMs), modelled as helicoidally arranged stacks of ellipsoidal inclusions in vacuum. Spectral maximums of several observ

Errata to: “nominal model for structure-
Errata to: “nominal model for structure-property relations of chiral dielectric sculptured thin films”: Mathl. Comput. Modelling, Vol. 34, No. 12/13, pp. 1499–1514, 2001
✍ J.A. Sherwin; A. Lakhtakia 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 644 KB

In the subject paper, calculations reported for the stated angular valuea of x were actually made for n/2 -x. Consequently, Figures l-7 are incorrect, and a few quantitative, but not qualitative, conclusions drawn therefrom are also incorrect. The error in the computer program came to light very rec