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Noise modeling and SiGe profile design tradeoffs for RF applications [HBTs]

โœ Scribed by Guofu Niu; Shiming Zhang; Cressler, J.D.; Joseph, A.J.; Fairbanks, J.S.; Larson, L.E.; Webster, C.S.; Ansley, W.E.; Harame, D.L.


Book ID
114538312
Publisher
IEEE
Year
2000
Tongue
English
Weight
148 KB
Volume
47
Category
Article
ISSN
0018-9383

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