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Noise Behavior of a 180 nm CMOS SOI Technology for Detector Front-End Electronics

✍ Scribed by Re, Valerio; Gaioni, Luigi; Manghisoni, Massimo; Ratti, Lodovico; Speziali, Valeria; Traversi, Gianluca; Yarema, Ray

Book ID: 124091419
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 264 KB
Volume: 55
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2008.2001082

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