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Noise characterisation of MOS transistors in a 0.35 μm CMOS technology of geometries dedicated to front-end circuits for strip detectors

✍ Scribed by Fiutowski, T; Dabrowski, W

Book ID: 121406807
Publisher: IOP Publishing
Year: 2006
Tongue: English
Weight: 236 KB
Volume: 1
Category: Article
ISSN: 1748-0221
DOI: 10.1088/1748-0221/1/11/P11001

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