𝔖 Bobbio Scriptorium

✦ LIBER ✦

Noise and y-parameters in MOS FET's : P. S. Rao and A. Van der Ziel. Solid State Electron.14 (1971), p. 939

Publisher: Elsevier Science
Year: 1972
Tongue: English
Weight: 115 KB
Volume: 11
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(72)90188-6

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Noise in junction- and MOS-FETs at high

Noise in junction- and MOS-FETs at high temperatures : A. van der Ziel, Solid-St. Electron. 12 (1969), p. 861

📂 Article 📅 1970 🏛 Elsevier Science 🌐 English ⚖ 107 KB

Gate noise in MOS FET's at moderately hi

Gate noise in MOS FET's at moderately high frequencies : J. W. Haslett and F. N. Trofimenkoff, Solid-St. Electron.14 (1971), p. 239

📂 Article 📅 1971 🏛 Elsevier Science 🌐 English ⚖ 209 KB

Noise in phosphorus-implanted buried cha

Noise in phosphorus-implanted buried channel MOS transistors: S. T. Liu, O. N. Tufte, A. van der Ziel, S. Y. Pai and W. Larson. Solid-St. Electron. 23, 1195 (1980)

📂 Article 📅 1981 🏛 Elsevier Science 🌐 English ⚖ 126 KB

Effects of the substrate on surface stat

Effects of the substrate on surface state noise in silicon MOS FET's : J. W. Haslett and F. N. Trofimenkoff. Solid State Electron.15 (1972), p. 117

📂 Article 📅 1972 🏛 Elsevier Science 🌐 English ⚖ 104 KB

Generation-recombination noise at 77°K i

Generation-recombination noise at 77°K in silicon bars and JFETs : A. Van Der Ziel, R. Jindal. S. K. Kim. H. Park and J. P. Nougier. Solid-St. Electron. 22, 177 (1979)

📂 Article 📅 1979 🏛 Elsevier Science 🌐 English ⚖ 116 KB