✦ LIBER ✦
Generation-recombination noise at 77°K in silicon bars and JFETs : A. Van Der Ziel, R. Jindal. S. K. Kim. H. Park and J. P. Nougier. Solid-St. Electron. 22, 177 (1979)
- Publisher
- Elsevier Science
- Year
- 1979
- Tongue
- English
- Weight
- 116 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0026-2714
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