Gate noise in MOS FET's at moderately high frequencies : J. W. Haslett and F. N. Trofimenkoff, Solid-St. Electron.14 (1971), p. 239

• Publisher: Elsevier Science
• Year: 1971
• Tongue: English
• Weight: 209 KB
• Volume: 10
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(71)90180-6