✦ LIBER ✦
Noise in phosphorus-implanted buried channel MOS transistors: S. T. Liu, O. N. Tufte, A. van der Ziel, S. Y. Pai and W. Larson. Solid-St. Electron. 23, 1195 (1980)
- Publisher
- Elsevier Science
- Year
- 1981
- Tongue
- English
- Weight
- 126 KB
- Volume
- 21
- Category
- Article
- ISSN
- 0026-2714
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