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Ni-defective value and resistivity of sputtered NiO films

✍ Scribed by O. Kohmoto; H. Nakagawa; F. Ono; A. Chayahara

Book ID: 114224086
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 70 KB
Volume: 226-230
Category: Article
ISSN: 0304-8853
DOI: 10.1016/s0304-8853(00)01042-8

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