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News Ticker: Imaging & Microscopy 2/2007


Publisher
Wiley (John Wiley & Sons)
Year
2007
Weight
81 KB
Volume
9
Category
Article
ISSN
1439-4243

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โœฆ Synopsis


and co-workers form the University of Sofia, Bulgaria, describe a low-cost microcontroller based control and data acquisition unit for digital image recording of scanning electron microscope (SEM) images and scanning electron microscope based electron beam lithography (EBL). It incorporates major time critical functions for image acquisition and electron beam lithography and makes the unit an intelligent module which communicates with the main computer via USB. The system allows, for instance, the recording of images with up to 4096 ร— 4096 pixel size, different scan modes, controllable dwell time, synchronization with main power frequency, and can extend the scanning electron microscope capabilities for electron beam lithography.


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