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Stukalov and co-workers from the University of Guelph, Ontario, Canada, designed and tested the performances of a small chamber allowing relative humidity control during AFM measurements. The chamber encloses the sample, the cantilever holder, and a commercial humidity/temperature sensor. Passing a controlled ratio of dry and humid nitrogen gas across the sample controls the RH. This system allows the RH at the sample position to be varied between 5 % and 95 % and controlled to within ยฑ0.2 % during an AFM measurement, with no measurable degradation of the scanner performances, opening possibilities for a wide array of studies needing RH standardisation.
Rev. Sci. Instrum. 77, 033704
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