๐”– Bobbio Scriptorium
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New scanning Electron Microscope


Book ID
119068557
Publisher
Elsevier Science
Year
1979
Tongue
English
Weight
140 KB
Volume
1
Category
Article
ISSN
0141-5425

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Scanning electron microscope magnifies f
๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 97 KB

## Software for stress analysis PANalytical's X'Pert Stress Plus 2.0 software package enables the analysis of residual stresses in amorphous substrates, polycrystalline coatings, or single crystals. The new software is part of a package that includes PANalytical's X'Pert PRO hardware platform and