๐”– Bobbio Scriptorium
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New high-performance scanning electron microscope


Book ID
115857491
Publisher
Elsevier Science
Year
1977
Tongue
English
Weight
139 KB
Volume
13
Category
Article
ISSN
0012-8252

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Scanning electron microscope magnifies f
๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 97 KB

## Software for stress analysis PANalytical's X'Pert Stress Plus 2.0 software package enables the analysis of residual stresses in amorphous substrates, polycrystalline coatings, or single crystals. The new software is part of a package that includes PANalytical's X'Pert PRO hardware platform and