Scanning electron microscope magnifies further

• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 97 KB
• Volume: 10
• Category: Article
• ISSN: 1369-7021
• DOI: 10.1016/s1369-7021(07)70106-2

✦ Synopsis

Software for stress analysis

PANalytical's X'Pert Stress Plus 2.0 software package enables the analysis of residual stresses in amorphous substrates, polycrystalline coatings, or single crystals. The new software is part of a package that includes PANalytical's X'Pert PRO hardware platform and the stress measurement software, X'Pert Data Collector 2.2. Examples of applications include analysis of TiC on steel, TiAlN coatings on tool inserts, surface stresses in ceramics, and oxide coatings on glass. X'Pert Stress Plus 2.0 supports data for grazing incidence measurements and multiple peak analysis.