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486. Scanning electron microscope


Publisher
Elsevier Science
Year
1970
Tongue
English
Weight
145 KB
Volume
20
Category
Article
ISSN
0042-207X

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## Software for stress analysis PANalytical's X'Pert Stress Plus 2.0 software package enables the analysis of residual stresses in amorphous substrates, polycrystalline coatings, or single crystals. The new software is part of a package that includes PANalytical's X'Pert PRO hardware platform and