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New method of determination of the flat-band voltage in SOI MOS structures

✍ Scribed by Krzysztof Iniewski; Andrzej Jakubowski

Book ID: 107856779
Publisher: Elsevier Science
Year: 1986
Tongue: English
Weight: 372 KB
Volume: 29
Category: Article
ISSN: 0038-1101
DOI: 10.1016/0038-1101(86)90019-5

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