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Bulk lifetime determination of MOS structures by a voltage step response method

โœ Scribed by C. Trullemans; F. Van de Wiele


Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
315 KB
Volume
21
Category
Article
ISSN
0038-1101

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๐Ÿ“œ SIMILAR VOLUMES


Determination of recombination lifetime
โœ P. Peykov; T. Diaz; M. Aceves ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 100 KB

A sine-voltage technique for measurements of recombination lifetime in metal oxide semiconductor (MOS) structures is proposed. When a fast sine-voltage sweep ramp is applied to the gate of an MOS capacitor a non-equilibrium depletion layer is formed and electron-hole generation starts in the space-c