Bulk lifetime determination of MOS structures by a voltage step response method : C. Trullemans and F. Van de Wiele. Solid-St. Electron. 21, 561 (1978)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 115 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90346-3