In this paper, a reliable procedure, which allows a fine as well as a robust analysis of the deep defects in semiconductors, is detailed. In this procedure where capacitance transients are considered as multiexponential and corrupted with Gaussian noise, our new method of analysis, the Levenberg-Mar
β¦ LIBER β¦
New correlation procedure for the improvement of resolution of deep level transient spectroscopy of semiconductors
β Scribed by Istratov, A. A.
- Book ID
- 121492416
- Publisher
- American Institute of Physics
- Year
- 1997
- Tongue
- English
- Weight
- 237 KB
- Volume
- 82
- Category
- Article
- ISSN
- 0021-8979
- DOI
- 10.1063/1.366269
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