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Near-field scanning Raman microscopy using apertureless probes

โœ Scribed by W. X. Sun; Z. X. Shen

Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
290 KB
Volume
34
Category
Article
ISSN
0377-0486

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โœฆ Synopsis

Abstract

We describe an apertureless nearโ€field scanning Raman microscope in reflection geometry developed by integrating a nearโ€field scanning optical microscope and a Raman spectrometer. This setโ€up offers some unique features that make it applicable to more samples. The fabrication of the metal tips is also explained in detail. Nearโ€field Raman mappings have been realized on real silicon devices for the first time. The results illustrate the capability of our nearโ€field Raman microscope in 2D Raman imaging. The apertureless configuration is a breakthrough to the limitation set by the low optical throughput of metalโ€coated optical fiber tips, reducing drastically the integration time for Raman spectra. The reflection scattering geometry makes the system applicable to any samples without preparation. Copyright ยฉ 2003 John Wiley & Sons, Ltd.

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