## Abstract This report presents the Apertureless Scanning Optical NearโField Microscope as a powerful tool for the characterization of modern optoelectronic and photonic components with subโwavelength resolution. We present an overview of the results we obtained in our laboratory over the past few
โฆ LIBER โฆ
Factors that influence confocal apertureless near-field scanning optical microscopy
โ Scribed by Vladimir V Protasenko; Alan Gallagher; David J Nesbitt
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 528 KB
- Volume
- 233
- Category
- Article
- ISSN
- 0030-4018
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We have demonstrated recently the operation of depolarization near-รeld scanning optical microscopy (DP-NSOM), a technique that allows optical near-รeld imaging with uncoated optical รbre tips by making use of the depolarizing e โ ect of the tip-sample near-รeld. We have shown both experimentally and