Depolarization near-field scanning optical microscopy: influence of wavelength and tip shape on the lateral resolution
✍ Scribed by von Freymann, G.; Wegener, M.; Schimmel, Th.
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 96 KB
- Volume
- 27
- Category
- Article
- ISSN
- 0142-2421
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✦ Synopsis
We have demonstrated recently the operation of depolarization near-Ðeld scanning optical microscopy (DP-NSOM), a technique that allows optical near-Ðeld imaging with uncoated optical Ðbre tips by making use of the depolarizing e †ect of the tip-sample near-Ðeld. We have shown both experimentally and by computer simulations that optical subwavelength resolution is obtained. Here, the dependence of the DP-NSOM imaging contrast and resolution on the wavelength and the tip shape is investigated in detail by computer simulations. We show explicitly that the resolution obtained does not depend on the wavelength of light, thus demonstrating true near-Ðeld imaging. The results show that the DP-NSOM imaging process does not depend critically on details of the shape of the Ðbre tip.