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NBTI reliability on high-k metal-gate SiGe transistor and circuit performances

✍ Scribed by Jiann-Shiun Yuan; Wen-Kuan Yeh; Shuyu Chen; Chia-Wei Hsu

Book ID: 108210925
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 519 KB
Volume: 51
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2010.12.015

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