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Native defects in Al[sub 2]O[sub 3] and their impact on III-V/Al[sub 2]O[sub 3] metal-oxide-semiconductor-based devices

✍ Scribed by Weber, J. R.; Janotti, A.; Van de Walle, C. G.

Book ID: 121716905
Publisher: American Institute of Physics
Year: 2011
Tongue: English
Weight: 319 KB
Volume: 109
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.3544310

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