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Native defects at the Si/SiO2 interface-amorphous silicon revisited

✍ Scribed by D.K. Biegelsen; N.M. Johnson; M. Stutzmann; E.H. Poindexter; P.J. Caplan


Book ID
108004404
Publisher
Elsevier Science
Year
1985
Weight
501 KB
Volume
22-23
Category
Article
ISSN
0378-5963

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