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A model of interface defect states at Si/SiO2 amorphous (non-periodic) interfaces

✍ Scribed by M.R. Beltrán

Book ID: 115989208
Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 878 KB
Volume: 163
Category: Article
ISSN: 0022-3093
DOI: 10.1016/0022-3093(93)90763-n

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