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Nanocrystal characterization by ellipsometry in porous silicon using model dielectric function

✍ Scribed by Petrik, Peter; Fried, Miklos; Vazsonyi, Eva; Basa, Peter; Lohner, Tivadar; Kozma, Peter; Makkai, Zsolt

Book ID: 121671773
Publisher: American Institute of Physics
Year: 2009
Tongue: English
Weight: 833 KB
Volume: 105
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.3068479

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