✦ LIBER ✦
Porosity depth profiling of thin porous silicon layers by use of variable-angle spectroscopic ellipsometry: a porosity graded-layer model
✍ Scribed by Pettersson, Leif A. A. ;Hultman, Lars ;Arwin, Hans
- Book ID
- 115347200
- Publisher
- The Optical Society
- Year
- 1998
- Tongue
- English
- Weight
- 491 KB
- Volume
- 37
- Category
- Article
- ISSN
- 1559-128X
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