Model dielectric function analysis of the critical point features of silicon nanocrystal films in a broad parameter range

✍ Scribed by Agocs, Emil; Nassiopoulou, Androula G.; Milita, Silvia; Petrik, Peter

• Book ID: 122527142
• Publisher: Elsevier Science
• Year: 2013
• Tongue: English
• Weight: 488 KB
• Volume: 541
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/j.tsf.2012.10.126