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MOS/LSI circuit design: designing-in reliability : H. W. van Beck. 10th IEEE Annual Proceedings, Reliability Physics 1972, p. 36

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 113 KB
Volume: 12
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(73)90627-6

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