✦ LIBER ✦
Degradation of MNOS memory transistor characteristics and failure mechanism model : M. H. Woods and J. W. Tuska. 10th IEEE Annual Proceedings, Reliability Physics (1972), p. 120
- Publisher
- Elsevier Science
- Year
- 1973
- Tongue
- English
- Weight
- 111 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0026-2714
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