Metallization failures caused by organic adhesives used in hybrid microelectronic devices : R. S. Spriggs and A. H. Cronshagen. 10th IEEE Annual Proceedings, Reliability Physics (1972), p. 201

• Publisher: Elsevier Science
• Year: 1973
• Tongue: English
• Weight: 114 KB
• Volume: 12
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(73)90487-3