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Wire-bond reliability in hybrid microcircuits : R. S. Spriggs and A. H. Cronshagen. IEEE 11th Annual Proceedings Reliability Physics (1973). p. 83

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 108 KB
Volume: 12
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(73)90156-x

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