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Failure analysis of oxide defects : G. H. Ebel and H. A. Engelke. IEEE 11th Annual Proceedings Reliability Physics 1973. p. 108

Publisher: Elsevier Science
Year: 1973
Tongue: English
Weight: 106 KB
Volume: 12
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(73)90206-0

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