✦ LIBER ✦

MOSFET mobility degradation due to interface-states, generatd by Fowler-Nordheim electron injection.

✍ Scribed by A.T. Dejenfelt; O. Engström

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A model for hot-electron-induced MOSFET

✍ Chung, J.E.; Ko, P.-K.; Hu, C. 📂 Article 📅 1991 🏛 IEEE 🌐 English ⚖ 826 KB

Analysis of MOSFET degradation due to ho

✍ Sunil Shabde; Anjan Bhattacharyya; Ron S. Kao; Richard S. Muller 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 725 KB

Physical model of drain conductance, gd,

✍ Kurachi, I.; Nam Hwang; Forbes, L. 📂 Article 📅 1994 🏛 IEEE 🌐 English ⚖ 562 KB