✦ LIBER ✦
A model for hot-electron-induced MOSFET linear-current degradation based on mobility reduction due to interface-state generation
✍ Scribed by Chung, J.E.; Ko, P.-K.; Hu, C.
- Book ID
- 114537959
- Publisher
- IEEE
- Year
- 1991
- Tongue
- English
- Weight
- 826 KB
- Volume
- 38
- Category
- Article
- ISSN
- 0018-9383
- DOI
- 10.1109/16.81627
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