✦ LIBER ✦
Physical model of drain conductance, gd, degradation of NMOSFET's due to interface state generation by hot carrier injection
✍ Scribed by Kurachi, I.; Nam Hwang; Forbes, L.
- Book ID
- 114535736
- Publisher
- IEEE
- Year
- 1994
- Tongue
- English
- Weight
- 562 KB
- Volume
- 41
- Category
- Article
- ISSN
- 0018-9383
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