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MOS capacitance measurements for high-leakage thin dielectrics

✍ Scribed by Yang, K.J.; Chenming Hu

Book ID: 114537794
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 46 KB
Volume: 46
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.772500

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