✦ LIBER ✦
Capacitance reconstruction from measured C-V in high leakage, nitride/oxide MOS
✍ Scribed by Chang-Hoon Choi; Wu, Y.; Jung-Suk Goo; Zhiping Yu; Dutton, R.W.
- Book ID
- 114538291
- Publisher
- IEEE
- Year
- 2000
- Tongue
- English
- Weight
- 251 KB
- Volume
- 47
- Category
- Article
- ISSN
- 0018-9383
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