The morphology of porous silicon layers has been investigated by polarization resolved photoluminescence measurements in different geometrical arrangements. A uniaxial alignment of the long ellipsoidal axis of the aspheric Si nanocrystallites (NCs) parallel to the [100] growth direction is found. Th
Morphology of self-supporting porous silicon layers
β Scribed by R. M. Vadjikar; R. V. Nandedkar; D. D. Bhawalkar; S. Venketachalam; A. Dussani; A. N. Chandorkar
- Publisher
- Springer
- Year
- 1994
- Tongue
- English
- Weight
- 545 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0261-8028
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